AFM Raman workshop focusing on both Tip Enhanced Raman and co-localised AFM Raman

(Nanowerk News) Bruker and Renishaw would like to invite you to an AFM Raman workshop focusing on both Tip Enhanced Raman and co-localised AFM Raman at Renishaw’s headquarters on January 21, 2015.
Recent advances in the integration of AFM nanoscale analysis and Raman chemical fingerprinting now make this combined technique accessible to researchers in all scientific disciplines. The workshop will highlight applications and technology development as well as provide the opportunity to network with researchers in this field.
Invited speakers will discuss cutting edge applications including graphene, biological/pharmaceutical applications and device characterisation. Practical workshops will highlight new instrumental innovations and experimental best practice.
Presentations include:
"AFM and Raman Characterisation of Graphene and 2D materials" – Aravind Vijayaraghavan, National Graphene Institute, University of Manchester
"Integrated AFM Raman and Nanomechanical Mapping on Novel Materials” – Mickael Febvre, Bruker Nano Surfaces
"AFM Raman studies of biomedical coatings" – Claus Burkhardt, Natural and Medical Institute – NMI – University of Tübingen
"Advances in integration of AFM and Raman" – Tim Batten, Renishaw
The workshop runs from 09.30 to 16.00 at Renishaw’s UK headquarters in Wotton under Edge, Gloucestershire, close to Bristol. There is no cost for this event but space is limited.
Source: Bruker
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