Call for papers: Group IV Photonics Conference, focusing on silicon photonic convergence

(Nanowerk News) The 2014 International Group IV Photonics Conference, sponsored by the IEEE Photonics Society, announces a Call for Papers seeking original research on the Electro Photonic Convergence on Silicon; Novel Materials and Structures; and Photonic Devices and Nanophotonics. The conference is scheduled for 27 - 29 August, 2014, at the Cité Internationale Universitaire de Paris in Paris, France.
Now in its eleventh year, the Group IV Photonics Conference (GFP-2014) provides attendees with insights on the current and future developments in silicon photonics, and other Group IV element-based photonic materials and devices, including integration and fabrication technologies. As a single-track conference, GFP-2014 fosters one-on-one interaction between colleagues, including oral and poster sessions of contributed and invited papers, as well as a plenary session with reviews of important topics in Group IV element photonics.
Paper submission begins on 10 February, 2014, and the final deadline is 18 March, 2014. Authors will be notified in mid-May of their paper status. The complete Call for Papers can be found at
Papers are invited in the following areas:
  • Electro-Photonic Convergence on Silicon – including the mainstreaming of industrial Si photonics; optical interconnect technology (light sources, modulators, and detectors); as well as industrial fabrication technology (integration of technology platforms and design tools/rules).
  • Photonic Devices and Nanophotonics - including current and future silicon photonics applications in telecom, sensing, and photovoltaics that do not necessarily require integration with electronics.
  • Novel Materials and Structures – covering advanced materials and material combinations, as well as structures that are generating scientific interest, including graphene, complex oxides, photonic crystals, gratings, and plasmonics.
  • For registration and other information about GFP-2014, visit
    Source: IEEE Photonics Society
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