| Posted: February 12, 2009 |
Free web-based seminar explores fundamentals of Hall Effect measurements |
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(Nanowerk News) Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Hall Effect Measurements Fundamentals" on Thursday, February 19, 2009. This one-hour seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization. To register for this event, visit www.keithley.com/events/semconfs/webseminars.
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Hall Effect measurement systems are commonly used to determine semiconductor parameters, such as carrier mobility and carrier concentration, Hall coefficient, and conductivity and conductivity type. Seminar participants will learn what Hall Effect measurements are, who can use them, what industry trends are driving the need for them, and what key equipment considerations are involved in configuring Hall Effect measurement systems. The event will conclude with a text-based Q&A session.
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This seminar is recommended for engineers and materials scientists developing thin films for solar/photovoltaic applications, as well as for those new to semiconductor materials and testing, anyone working with compound semiconductor materials, and characterization lab managers.
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Steven Weinzierl, Keithley's applications engineering manager, will present the seminar. Weinzierl holds a Ph.D. from Cornell University and has more than 15 years of semiconductor industry experience. He has published more than 30 refereed journal articles and conference papers and has been awarded one patent.
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Registration Information
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Hall Effect Measurements Fundamentals will be broadcast on February 19, 2009 at 3:00 p.m. Central European Time (9:00 a.m. EST) for the European audience and at 2:00 p.m. EST (8:00 p.m. Central European Time) for the North American audience. The event is free to the public, but advanced registration is required. The seminar will also be archived on Keithley's website for those unable to attend the original broadcast.
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