The development of nanoscale devices and applications requires ultra-sensitive sensing systems that can offer not only atomic resolution imaging but also sub nanometer scale displacement detection, zeptogram level mass sensing, or single bio-molecular sensing. Researchers have now developed a novel sensor that addresses some of the shortcomings that have plagued existing optical scanning systems , namely size, complexity, and cost. This sensing technology is completely electrical and capable of sensing very small displacement as low as in the femtometer range.
Researchers report a non-destructive and high throughput 3D imaging of carbon nanotubes (CNTs) embedded in polymer matrix via Scanning Electron Microscopy (SEM). While have been several open questions remaining for SEM subsurface imaging of CNTs, this new findings clarify these issues and help establish SEM subsurface imaging as a useful and facile method to provide quantitative 3D information on CNT dispersions in polymer composites.
The surface force balance (SFB) provides measurements of surface and colloidal forces in liquids such as electrostatic surface forces, van der Waals forces, and solvation forces. Until now, the SFB required mica sheets as the substrate for measurements. This was the only material available in an atomically smooth state over centimeter-scale areas as well as being optically transparent as required for the optical interferometry. By replacing the mica sheets with graphene, electrically conducting and atomically smooth surfaces for the measurement of surface forces have now been created.
Researchers have demonstrated a new imaging technique that is a marriage between two powerful methods and it promises simultaneous spatial and elemental information of the samples down to the atomic scale. By combining scanning tunneling microscopy (STM) with synchrotron X-ray microscopy, there is now an instrument (SX-STM) that has the potential to perform all the applications of STM and X-rays in a single setting at the ultimate atomic limit.
The desire to identify materials and their properties to understand complex systems and better engineer their functions has been driving scanning probe microscopies since their inception. Both atomic force microscopy (AFM) and Raman spectroscopy are techniques used to gather information about the surface properties and chemical information of a sample. There are many reasons to combine these two technologies, and this application note discusses both the complementary information gained from the techniques and how a researcher having access to a combined system can benefit from the additional information available.
Surface metrology and characterization is ever more critical for overall product performance in wide ranging applications across the semi-conductor, LED, data storage, medical and automotive industries. 3D optical microscopes are among the fastest and most accurate imaging systems on the market today, and are employed in these industries for rapid and precise process monitoring, product development, and research. However, there are instances where they have performance limitations and the benefits of scanning probe/atomic force microscopy provide a clear advantage.
Measuring and mapping mechanical properties of live cells is of high importance in today's biological research. raditionally, force spectroscopy and force volume are the most commonly used modes to quantitatively measure mechanical forces at the nanometer scale. Unfortunately, both techniques have suffered from slow acquisition speed and a lack of automated tools to analyze the hundreds to thousands of curves required for good statistics. This application note reviews recent progress in mapping the properties of soft samples such as cells and gels with force volume and PeakForce QNM and the use of the newest NanoScope and NanoScope Analysis features to collect and analyze the data from these techniques.
The realization of a three-dimensional atomic force microscopy portends exciting research directions across nanoscience and nanotechnology. Demonstrations to date have been limited by the indirect means that are required to extract a three-dimensional force vector from the traditional 1D observable in AFM (i.e., cantilever deflection). Existing 3D AFM techniques require recording thousands of frequency shift curves at different lateral locations followed by off-line integration (to yield energy) and lateral differentiation (to yield lateral force). This procedure is inherently slow. In new work, researchers now report 3D force measurements based on a 3D local observable, rather than on cantilever deflection alone.